Influence of material surface roughness on backscattering in laser scanning

Abstract

In this paper, the possibility of applying Kirchhoff 's scalar approximation model for determining the backscattering coefficient from rough surfaces is investigated. Surfaces of dielectric and metallic materials, which have low roughness are considered. Based on the roughness parameters and electrical properties of these materials, the backscattering coefficient is modelled as a function of the incident angle of electromagnetic radiation used in laser scanning. It was represented that the type of scattering and the range of backscattering radiation angles, in the case of seemingly smooth surfaces, vary significantly when the roughness parameters change.